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PR-EX-TnIR-A-10 0.2 N/m 75 Cantilever Thickness (RNG): 1

SKU: 40740481619

4.2
USD333.50 USD383.50

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Ships within 48 hours · Estimated delivery Aug 12 - Aug 17

Description

75 Cantilever Thickness (RNG): 1

3 MESP-LM-V2 probes

Also enables TR-TUNA on MultiMode SPMs equipped with both TUNA and TR Mode

Calibration Artifact: 180nm Depth

PR-EX-TnIR-A-10 0.2 N/m 75 Cantilever Thickness (RNG): 1DESCRIPTION SPECIFICATIONS 10 pack of probes for use in the nanoIR2 2S 2FS systems for AFM imaging in Tapping mode and IR spectral collection in contact mode. Also required for Tapping AFM IR chemical imaging where the feature is available. Gold coated, microfabricated silicon probes that are ~225 microns long and come pre mounted on half washer mounts for easy exchange in the AFM head. Shape: Rotated Height: 17 m (15 19 m)* Setback: 15 m (10 20 m)*

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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