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The central line area may be used for AFM measurements
Hole Width 85µm
these are formed out of single crystal boron doped diamond and are wear resistant and conductive
Optical Microscopy: reflected
SiC-STEP Calibration Samples Step Height:0.75nm The central line area mayDESCRIPTION 6H SiC (0001) based calibration sample which is designed to perform easy calibrations of an AFM scanner's vertical movements in several nanometers interval. The simplicity of calibration of the calibration process is provided by the nearly uniform distribution of half monolayer high steps (either 0. 75 or 1. 5nm) on the sample surface demonstrating both chemical and mechanical stability. The step height corresponds to the half of the
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